Dear Colleagues:
We are pleased to announce a special issue in conjunction with the VISION workshop hosted at ICCV 2025 in Honolulu, Hawaii. This special issue will be published in the journal Machine Vision and Applications.
We invite authors to submit papers that include an extension of 30-40% new material beyond what was presented at the workshop proceedings. However, we also welcome original submissions that have not been part of the workshop. This ensures a diverse and comprehensive collection of cutting-edge research in the field of machine vision for industrial inspection. All submissions will be rigorously reviewed according to journal standards to ensure high-quality contributions to the field.
The scope of this special issue includes, but is not limited to, the following topics:
- Advanced algorithms in machine vision
- Innovative applications of industrial vision systems
- Real-time processing and analysis
- Defect detection and identification in manufacturing processes
- Vision-based industrial automation
Key Dates:
- Submissions Open: 14 November 2025
- Submission Deadline:20 January 2026
-Review deadline: April 20, 2026
-Revision deadline: May 20, 2026
-Final notification / final decisions: June/July 2026
Editors:
- Juan Du
The Hong Kong University of Science and Technology (Guangzhou)
The Hong Kong University of Science and Technology
- Hao Yan
Arizona State University, Arizona, United States of America
- Shancong Mou
University of Minnesota, Twin Cities, Minnesota, United States of America
- Gokberk Cinbis
Middle East Technical University (METU), Türkiye
- Zirui (Ray) Liu
University of Minnesota, Twin Cities, Minnesota, United States of America
We look forward to receiving your contributions and to advancing the field of machine vision for industrial inspection through this special issue. This is a unique opportunity to showcase your work to a global audience and contribute to the development of innovative solutions in machine vision for industrial inspection.
PS: Special Issue Link: https://link.springer.com/collections/acjjacdgbd
Thank you.
Shancong Mou
On behalf of the Special Issue Guest Editorial Team.